Anomaly Detection for Equipment Condition via Frequency...

Advanced Materials Research 2012 / 1 Vol. 433-440

Anomaly Detection for Equipment Condition via Frequency Spectrum Entropy

Cheng, Wei Dong, Wang, Tian Yang, Wen, Wei Gang, Wang, Heng, Li, Jian Yong
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Volume:
433-440
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/amr.433-440.3753
Date:
January, 2012
File:
PDF, 291 KB
english, 2012
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