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Nanometric-Size Effect upon Diffusion and Reaction in Semiconductors: Experimental and Theoretical Investigations
Portavoce, Alain, Girardeaux, Christophe, Tréglia, Guy, Bernardini, Jean, Mangelinck, Dominique, Chow, LeeVolume:
323-325
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/ddf.323-325.433
Date:
April, 2012
File:
PDF, 469 KB
english, 2012