Analysis of Beta-Ray Data Using the Wavelet Thresholding Method and Extended Kalman Filter
Han, Sung Hwan, Kim, Hyeon Ho, Bae, Hyeon DeokVolume:
270-273
Year:
2004
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/kem.270-273.174
File:
PDF, 225 KB
english, 2004