Bulk Thickness and Short Circuit Capacity of a 1200V 4H-SiC VJFET
Niu, Shi, Berthou, Maxime, Tournier, DominiqueVolume:
821-823
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.821-823.797
Date:
June, 2015
File:
PDF, 544 KB
english, 2015