SPIE Proceedings [SPIE Optics for Productivity in Manufacturing - Frankfurt, Federal Republic of Germany (Sunday 19 June 1994)] Optical Measurements and Sensors for the Process Industries - Surface profiling by frequency-domain analysis of white light interferograms
de Groot, Peter J., Deck, Leslie L., Gorecki, Christophe, Preater, Richard W. T.Volume:
2248
Year:
1994
Language:
english
DOI:
10.1117/12.194308
File:
PDF, 224 KB
english, 1994