![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Gallium Nitride Materials and Devices X - Enhancement of optical and structural quality of semipolar (11-22) GaN by introducing nanoporous SiN x interlayers
Chyi, Jen-Inn, Fujioka, Hiroshi, Morkoç, Hadis, Monavarian, Morteza, Metzner, Sebastian, Izyumskaya, Natalia, Müller, Marcus, Okur, Serdal, Zhang, Fan, Can, Nuri, Das, Saikat, Avrutin, Vitaliy, Özgür,Volume:
9363
Year:
2015
Language:
english
DOI:
10.1117/12.2079180
File:
PDF, 977 KB
english, 2015