SPIE Proceedings [SPIE St. Petersburg - DL over - St. Petersburg (Monday 7 June 2004)] Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering - Sub-pixel precise image analysis in the industrial environment
Potapov, Alexey S., Luciv, Vadim R., Malyshev, Igor A., Melker, Alexander I.Volume:
5831
Year:
2005
Language:
english
DOI:
10.1117/12.619700
File:
PDF, 429 KB
english, 2005