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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California (Sunday 23 January 2011)] Image Processing: Machine Vision Applications IV - Monitoring plant growth using high resolution micro-CT images
Paquit, Vincent C., Gleason, Shaun S., Kalluri, Udaya C., Fofi, David, Bingham, Philip R.Volume:
7877
Year:
2011
Language:
english
DOI:
10.1117/12.876719
File:
PDF, 4.18 MB
english, 2011