PSP Statistical Modeling for 40nm MOSFET

PSP Statistical Modeling for 40nm MOSFET

Zhou, Hui, Li, Xi, Ren, Zheng, Zhang, Meng Di, Sun, Li Jie, Hu, Shao Jian, Shi, Yan Ling
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Volume:
236-237
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.236-237.144
Date:
November, 2012
File:
PDF, 639 KB
english, 2012
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