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Micro Line Quality Measurement Based on Normally Scanned Digital Image
Cui, Xiao Meng, Chen, Guang Xue, Wang, Huan Mei, Chen, Lin LinVolume:
236-237
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.236-237.839
Date:
November, 2012
File:
PDF, 507 KB
english, 2012