Crystallinity and Characterization of Rf-Magetron Sputtered...

Advanced Materials Research 2012 / 3 Vol. 486

Crystallinity and Characterization of Rf-Magetron Sputtered ZnO-Doped (Zr0.8Sn0.2)TiO4 Thin Films on ITO/Glass Substrate

Hsu, Cheng Hsing, Yang, Pai Chuan, Chen, Wen Shiush, Lin, Jenn Sen
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Volume:
486
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.486.345
Date:
March, 2012
File:
PDF, 330 KB
english, 2012
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