Analysis of Thin Film Cracking and Buckling on Compliant Substrate by Fragmentation Test
Andersons, Janis, Tarasovs, S., Leterrier, YvesVolume:
348-349
Year:
2007
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.348-349.329
File:
PDF, 252 KB
english, 2007