Analysis of Lattice Defects in an Epitaxial PbTiO3 Thick...

Key Engineering Materials 2013 / 7 Vol. 566

Analysis of Lattice Defects in an Epitaxial PbTiO3 Thick Film by Transmission Electron Microscopy

Aoyagi, Kenta, Kiguchi, Takanori, Ehara, Yoshitaka, Funakubo, Hiroshi, Konno, Toyohiko J.
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Volume:
566
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.566.171
Date:
July, 2013
File:
PDF, 640 KB
english, 2013
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