Relationship between PB content, crystallographic texture...

Integrated Ferroelectrics 2001 / 01 Vol. 33; Iss. 1-4

Relationship between PB content, crystallographic texture and ferroelectric properties of plzt thin films for FRAM® applications

Chu, Fan, Fox, Glen
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Volume:
33
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108222284
Date:
January, 2001
File:
PDF, 330 KB
english, 2001
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