![](/img/cover-not-exists.png)
Controlled fabrication of nanopores using a direct focused ion beam approach with back face particle detection
Patterson, N, Adams, D P, Hodges, V C, Vasile, M J, Michael, J R, Kotula, P GVolume:
19
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/19/23/235304
Date:
June, 2008
File:
PDF, 946 KB
english, 2008