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[IEEE 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (3-7 Feb. 2002)] 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) - A method for reducing the effects of random mismatches in CMOS bandgap references
Ceekala, V.G., Lewicki, L.D., Wieser, J.B., Varadarajan, D., Mohan, J.Volume:
1
Year:
2002
Language:
english
DOI:
10.1109/ISSCC.2002.993097
File:
PDF, 249 KB
english, 2002