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[IEEE 2006 6th World Congress on Intelligent Control and Automation - Dalian, China ()] 2006 6th World Congress on Intelligent Control and Automation - Research on Fault Diagnosis in Analog Circuit Based on Wavelet-Neural Network
Haiying Yuan,, Guangju Chen,, Sanbao Shi,, Huawei Chen,Year:
2006
Language:
english
DOI:
10.1109/WCICA.2006.1712845
File:
PDF, 117 KB
english, 2006