Quantitative evaluation of local charge trapping in...

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Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy

G. Lubarsky, R. Shikler, N. Ashkenasy, Y. Rosenwaks
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Year:
2002
Language:
english
DOI:
10.1116/1.1502701
File:
PDF, 569 KB
english, 2002
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