[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Scanning Probe Microscopy for Dielectric and Metal Characterization
Kopanski, Joseph J., Walker, Thomas R.Volume:
13
Year:
2008
Language:
english
DOI:
10.1149/1.2908629
File:
PDF, 299 KB
english, 2008