A novel algorithm for defect inspection of touch panels

A novel algorithm for defect inspection of touch panels

Hung, Mao-Hsiung, Hsieh, Chaur-Heh
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Volume:
41
Language:
english
Journal:
Image and Vision Computing
DOI:
10.1016/j.imavis.2015.06.001
Date:
September, 2015
File:
PDF, 2.79 MB
english, 2015
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