[IEEE 2015 International Symposium on VLSI Design,...

  • Main
  • [IEEE 2015 International Symposium on...

[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - A test-application-count based learning technique for test time reduction

Lin, Guo-Yu, Tsai, Kun-Han, Huang, Jiun-Lang, Cheng, Wu-Tung
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/vlsi-dat.2015.7114507
File:
PDF, 635 KB
english, 2015
Conversion to is in progress
Conversion to is failed