Tiefenscannende Weißlichtinterferometrie in maschinennaher...

Tiefenscannende Weißlichtinterferometrie in maschinennaher Umgebung

Tereschenko, Stanislav, Kühnhold, Peter, Lehmann, Peter, Zellmer, Lisa, Brückner-Foit, Angelika
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Volume:
81
Journal:
tm - Technisches Messen
DOI:
10.1515/teme-2014-0408
Date:
January, 2014
File:
PDF, 1017 KB
2014
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