Random Yield Model in Integrated Circuit Design

Random Yield Model in Integrated Circuit Design

Chen, Xiao Ming, Wu, Wen Qi, Li, Song Song
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
397-400
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/amm.397-400.1837
Date:
September, 2013
File:
PDF, 313 KB
english, 2013
Conversion to is in progress
Conversion to is failed