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Random Yield Model in Integrated Circuit Design
Chen, Xiao Ming, Wu, Wen Qi, Li, Song SongVolume:
397-400
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/amm.397-400.1837
Date:
September, 2013
File:
PDF, 313 KB
english, 2013