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Fatigue Monitoring of Double Surface Defects Using PZT Based Electromechanical Impedance and Digital Image Correlation Methods
Annamdas, Venu Gopal Madhav, Pang, John Hock Lye, Chew, You Xiang, Hoh, Hsin Jen, Zhou, Kun, Song, BinVolume:
891-892
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/amr.891-892.551
Date:
March, 2014
File:
PDF, 1.07 MB
english, 2014