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Fault Diagnostics Based on Pattern Spectrum Entropy and Proximal Support Vector Machine
Yu, Xiang Tao, Lu, Wen Xiu, Chu, Fu LeiVolume:
413-414
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/kem.413-414.607
Date:
June, 2009
File:
PDF, 375 KB
english, 2009