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Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes
Stahlbush, Robert E., Twigg, Mark E., Irvine, Kenneth G., Sumakeris, Joseph J., Chow, T.P., Losee, P.A., Zhu, Lin, Tang, Yi, Wang, W.Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.457-460.533
File:
PDF, 400 KB
english, 2004