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Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers
Klein, Paul B., Myers-Ward, Rachael L., Lew, Kok Keong, VanMil, Brenda L., Eddy Jr., Charles R., Gaskill, D. Kurt, Shrivastava, Amitesh, Sudarshan, Tangali S.Volume:
645-648
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.645-648.203
Date:
April, 2010
File:
PDF, 612 KB
english, 2010