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Experimental and comparative study of gamma radiation effects on Si-IGBT and SiC-JFET
Tala-Ighil, B., Trolet, J.-L., Gualous, H., Mary, P., Lefebvre, S.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.136
Date:
July, 2015
File:
PDF, 1.08 MB
english, 2015