![](/img/cover-not-exists.png)
[IEEE Comput. Soc . Design, Automation and Test in Europe Conference and Exhibition - Paris, France (16-20 Feb. 2004)] Proceedings Design, Automation and Test in Europe Conference and Exhibition - High security smartcards
Renaudin, M., Bouesse, F., Proust, Ph., Tual, J.P., Sourgen, L., Germain, F.Year:
2004
Language:
english
DOI:
10.1109/DATE.2004.1268853
File:
PDF, 217 KB
english, 2004