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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 14 April 2014)] Optical Micro- and Nanometrology V - A benchmark system for the evaluation of selected phase retrieval methods
Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Lingel, Christian, Hasler, Malte, Haist, Tobias, Pedrini, Giancarlo, Osten, WolfgangVolume:
9132
Year:
2014
Language:
english
DOI:
10.1117/12.2057472
File:
PDF, 298 KB
english, 2014