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Finite Element Modelling of Stress-Induced Fracture in Ti-Si-N Films
Flores-Johnson, E.A., Shen, Lu Ming, Annabattula, R.K., Onck, P.R., Shen, Yao Gen, Chen, ZhenVolume:
553
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.553.10
Date:
May, 2014
File:
PDF, 1.02 MB
english, 2014