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Investigation about I-V Characteristics in a New Electronic Structure Model of the Ohmic Contact for Future Nano-Scale Ohmic Contact
Takada, Yukihiro, Muraguchi, Masakazu, Endoh, Tetsuo, Nomura, Shintaro, Shiraishi, KenjiVolume:
470
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.470.43
Date:
February, 2011
File:
PDF, 407 KB
english, 2011