Quantitative Characterization of Band-Edge Energy Positions...

Japanese Journal of Applied Physics 2013 / 02 Vol. 52; Iss. 2R

Quantitative Characterization of Band-Edge Energy Positions in High- k Dielectrics by X-ray Photoelectron Spectroscopy

Chikata, Yugo, Kita, Koji, Nishimura, Tomonori, Nagashio, Kosuke, Toriumi, Akira
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Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.021101
Date:
February, 2013
File:
PDF, 984 KB
english, 2013
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