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Failure time prediction for mechanical device based on the degradation sequence
Wang, Yuanhang, Deng, Chao, Wu, Jun, Xiong, YaoVolume:
26
Language:
english
Journal:
Journal of Intelligent Manufacturing
DOI:
10.1007/s10845-013-0849-4
Date:
December, 2015
File:
PDF, 1.35 MB
english, 2015