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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Quality and Reliability for Optical Systems - Dimensional stability of high-purity Invar 36
Sokolowski, Witold M., Jacobs, Stephen F., Lane, Marc S., O'Donnell, Timothy P., Hsieh, Cheng, Bilbro, James W., Parks, Robert E.Volume:
1993
Year:
1993
Language:
english
DOI:
10.1117/12.164978
File:
PDF, 900 KB
english, 1993