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ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Enhanced Data Retention Characteristic on SOHOS-Type Nonvolatile Flash Memory with CF
Hsieh, Chih Ren, Chen, Yung-Yu, Lin, Wen-Sin, Lin, Gray, Lou, Jen-ChungYear:
2011
Language:
english
DOI:
10.1149/1.3568868
File:
PDF, 342 KB
english, 2011