Quantitative Method to Determine Planar Defect Frequency in...

Crystal Growth & Design 2015 / 08 Vol. 15; Iss. 8

Quantitative Method to Determine Planar Defect Frequency in InAs Nanowires by High Resolution X-ray Diffraction

Liu, Ziyang, Merckling, Clement, Caymax, Matty, Rooyackers, Rita, Collaert, Nadine, Thean, Aaron, Richard, Olivier, Bender, Hugo, Vandervorst, Wilfried, Heyns, Marc
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Volume:
15
Language:
english
Journal:
Crystal Growth & Design
DOI:
10.1021/acs.cgd.5b00489
Date:
August, 2015
File:
PDF, 3.94 MB
english, 2015
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