High-resolution quantitative determination of dielectric...

Scientific Reports 2015 / 7 Vol. 5

High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

Tranca, D. E., Stanciu, S. G., Hristu, R., Stoichita, C., Tofail, S. A. M., Stanciu, G. A.
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Volume:
5
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep11876
Date:
July, 2015
File:
PDF, 634 KB
english, 2015
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