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[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - Modellization of the breakdown voltage of four-layer punch-through TVS diodes
Urresti, J., Hidalgo, S., Flores, D., Roig, J., Vellvehi, M., Rebollo, J.Volume:
1
Year:
2004
Language:
english
DOI:
10.1109/ICMEL.2004.1314580
File:
PDF, 237 KB
english, 2004