[IEEE 2004 24th International Conference on...

[IEEE 2004 24th International Conference on Microelectronics - Nis, Serbia (16-19 May 2004)] 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716) - Modellization of the breakdown voltage of four-layer punch-through TVS diodes

Urresti, J., Hidalgo, S., Flores, D., Roig, J., Vellvehi, M., Rebollo, J.

How much do you like this book?

What’s the quality of the file?

Download the book for quality assessment

What’s the quality of the downloaded files?

Volume:

Year:

2004

Language:

english

DOI:

10.1109/ICMEL.2004.1314580

File:

PDF, 237 KB

english, 2004

Conversion to is in progress

Conversion to is failed