SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Physics and Simulation of Optoelectronic Devices XXI - Top-flat and top-patterned cone gratings for mid-infrared antireflective properties
Brückner, Jean-Baptiste, Le Rouzo, Judikaël, Escoubas, Ludovic, Flory, François, Simon, Jean-Jacques, Berginc, Gérard, Witzigmann, Bernd, Osinski, Marek, Henneberger, Fritz, Arakawa, YasuhikoVolume:
8619
Year:
2013
Language:
english
DOI:
10.1117/12.2004299
File:
PDF, 828 KB
english, 2013