SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Spatial phase-shifting moire deflectometry
Song, Yang, Chen, YunYun, He, Anzhi, Zhao, Zhimin, Yoshizawa, Toru, Wei, Ping, Zheng, JesseVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.837902
File:
PDF, 1.23 MB
english, 2009