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Effect of body biasing on single-event induced charge collection in deep N-well technology
Ding, Yi, Hu, Jian-Guo, Qin, Jun-Rui, Tan, Hong-ZhouVolume:
24
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/24/7/079401
Date:
July, 2015
File:
PDF, 422 KB
english, 2015