SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, USA (Monday 5 May 2014)] Active and Passive Signatures V - A collection and statistical analysis of skin reflectance signatures for inherent variability over the 250 nm to 2500 nm spectral range
Gilbreath, G. Charmaine, Hawley, Chadwick Todd, Cooksey, Catherine C., Tsai, Benjamin K., Allen, David W.Volume:
9082
Year:
2014
Language:
english
DOI:
10.1117/12.2053604
File:
PDF, 1.25 MB
english, 2014