SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Infrared Sensors, Devices, and Applications IV - Surface resistivity temperature dependence measures of commercial, multiwall carbon nanotubes (MWCNT), or silver nano-particle doped polyvinylidene difluoride (PVDF) and polyvinyl alcohol (PVA) films

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