SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Infrared Remote Sensing and Instrumentation XXII - 3D shape measurement with binary phase-shifted technique and digital filters
Strojnik Scholl, Marija, Páez, Gonzalo, Silva, Adriana, Legarda-Saenz, Ricardo, García-Torales, G., Balderas-Mata, Sandra, Flores, Jorge L.Volume:
9219
Year:
2014
Language:
english
DOI:
10.1117/12.2062479
File:
PDF, 1.83 MB
english, 2014