SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Infrared Sensors, Devices, and Applications IV - Analysis of local charge-carrier diffusion length values in the photosensing film of photovoltaic HgCdTe FPA photodetectors
LeVan, Paul D., Sood, Ashok K., Wijewarnasuriya, Priyalal, D'Souza, Arvind I., Vishnyakov, Alexei V., Stuchinsky, Victor A., Brunev, Dmitry V., Zverev, Alexei V., Dvoretsky, Sergey A.Volume:
9220
Year:
2014
Language:
english
DOI:
10.1117/12.2061573
File:
PDF, 541 KB
english, 2014