SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Evaluation and testing of semiconductor laser reliability in optic system
Tang, Wenyan, Fan, Xianguang, Sun, Heyi, Kulchin, Yuri N., Ou, Jinping, Vitrik, Oleg B., Zhou, ZhiYear:
2012
Language:
english
DOI:
10.1117/12.725682
File:
PDF, 209 KB
english, 2012