New Method of Evaluating the Crystallization Activation Energy of Ge 2 Sb 2 Te 5 by In situ Resistance Measurement
Jun, Hyun-Goo, Kwon, Min-Ho, Kang, Dongmin, Lee, Dongbok, Kim, Ki-BumVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.020214
Date:
February, 2011
File:
PDF, 655 KB
english, 2011