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[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Characterization of SiGe/Si Quantum Dot Grown by using APRPCVD
Kim, Taek Sung, Jeong, Mi Ra, Mun, Nan Ju, Kil, Yeon-Ho, Kim, Jan-Di, Jeong, Tae Soo, Kang, Sukil, Kim, Sang Hoon, Choi, Chel-Jong, Shim, Kyu-HwanYear:
2009
Language:
english
DOI:
10.1149/1.3204415
File:
PDF, 564 KB
english, 2009