Chemical and microstructural characterizations of plasma...

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Applied Surface Science 2015 / 7

Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis

Cossement, Damien, Renaux, Fabian, Thiry, Damien, Ligot, Sylvie, Francq, Rémy, Snyders, Rony
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2015.07.066
Date:
July, 2015
File:
PDF, 1.56 MB
english, 2015
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